MEASUREMENT OF SEMICONDUCTOR HETEROJUNCTION BAND DISCONTINUITIES BY X-RAY PHOTOEMISSION SPECTROSCOPY

被引:138
|
作者
WALDROP, JR
GRANT, RW
KOWALCZYK, SP
KRAUT, EA
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D O I
10.1116/1.573326
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:835 / 841
页数:7
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