INDUSTRIAL ELECTRONICS - NANOMETER RESOLUTION

被引：0
|
作者：
不详
机构：
来源：
IEEE SPECTRUM | 1993年 / 30卷 / 01期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
下载
收藏
页码：58 / 60
页数：3
相关论文
共 50 条
  • [1] Future nanometer electronics
    Gornik, E.
    1600, (21): : 1 - 4
  • [2] FUTURE NANOMETER ELECTRONICS
    GORNIK, E
    MICROELECTRONIC ENGINEERING, 1993, 21 (1-4) : 381 - 388
  • [3] Nanometer Resolution Dynamic Displacement Measurement in Industrial/High Noise Environments
    Joseph, Tim John
    Kartik, V.
    PROCEEDINGS 2016 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT), 2016, : 673 - 678
  • [4] Nanometer measurement with interpolation electronics
    Lin, Jium-Ming
    Hwang, Shau-Chieh
    EUROCON 2007: THE INTERNATIONAL CONFERENCE ON COMPUTER AS A TOOL, VOLS 1-6, 2007, : 989 - 994
  • [5] ELECTRONICS OF COLLOIDAL NANOMETER PARTICLES
    HENGLEIN, A
    BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1995, 99 (07): : 903 - 913
  • [6] Nanometer-scale electronics and storage
    Kelly, KF
    Donhauser, ZJ
    Lewis, PA
    Smith, RK
    Weiss, PS
    SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS, 2005, 186 : 333 - +
  • [7] Nanometer Layers and Structures in Silicon Electronics
    V. P. Popov
    V. A. Antonov
    M. S. Tarkov
    A. V. Myakon’kikh
    K. V. Rudenko
    Optoelectronics, Instrumentation and Data Processing, 2024, 60 (4) : 495 - 504
  • [8] INDUSTRIAL ELECTRONICS
    ELECCION, M
    IEEE SPECTRUM, 1974, 11 (01) : 44 - 53
  • [9] Industrial Electronics
    Gossick, Ben R.
    SCIENTIFIC MONTHLY, 1954, 79 : 343 - 344
  • [10] Industrial electronics
    Kaplan, G
    IEEE SPECTRUM, 1998, 35 (01) : 73 - +
12345