FAIL-SAFE LOGIC ELEMENTS FOR USE WITH REACTOR SAFETY SYSTEMS

被引：0
|
作者：
BOBIS, JP [1 ]
MCDOWELL, WP [1 ]
机构：
[1] ARGONNE NATL LAB,ARGONNE,IL 60439
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1977年 / 24卷 / 01期
关键词：
D O I：
10.1109/TNS.1977.4328761
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：659 / 661
页数：3
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