GENERALIZED AVAILABILITY MEASURES FOR A 2-UNIT INTERMITTENTLY USED REPAIRABLE SYSTEM

被引：3

作者：

KAPUR, PK ^{[1
]}

BUTANI, NL ^{[1
]}

DUTTA, D ^{[1
]}

机构：

[1] CHM COLL,THANA,MAHARASHTRA,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1984年 / 24卷 / 01期

关键词：

D O I：

10.1016/0026-2714(84)90634-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：29 / 34

页数：6

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