共 50 条
- [1] TRIPLE CRYSTAL X-RAY DIFFRACTOMETRIC STUDY OF THE EFFECT OF LOW-TEMPERATURE ANNEALING ON THE STRUCTURAL PARAMETERS OF JUVENILE SURFACES OF CSDSO4 AND CSH2PO4 SINGLE-CRYSTALS FIZIKA TVERDOGO TELA, 1991, 33 (12): : 3529 - 3534
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- [4] ESR INVESTIGATION OF X-RAY IRRADIATED SINGLE-CRYSTALS OF FERROELECTRIC KH2PO4 BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1972, 17 (03): : 309 - &
- [5] Structural investigation of synthetic CaTh(PO4)2 and CaNp(PO4)2 by X-ray diffraction ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2008, 64 : C492 - C492
- [6] HIGH-RESOLUTION X-RAY-DIFFRACTION STUDY OF DEFECT STRUCTURES PRODUCED BY HIGH DC ELECTRIC-FIELDS IN SILICON SINGLE-CRYSTALS MATERIALS SCIENCE AND ENGINEERING, 1987, 85 (1-2): : 147 - 156
- [8] STUDY OF MICROSTRUCTURAL CHANGES IN SILICON SINGLE-CRYSTALS SUBJECT TO HIGH ELECTRIC-FIELDS BY USING A HIGH-RESOLUTION X-RAY-DIFFRACTION METHOD PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 80 (02): : 491 - 502
- [9] STUDY OF MICROSTRUCTURAL DEFECTS INDUCED BY MICROWAVE ELECTRIC-FIELDS IN SILICON SINGLE-CRYSTALS BY A HIGH-RESOLUTION X-RAY-DIFFRACTION METHOD ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C336 - C336