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- [1] THEORY OF OPTICAL BEAM INDUCED CURRENT IMAGES OF DEFECTS IN SEMICONDUCTORSJOURNAL OF APPLIED PHYSICS, 1987, 61 (01) : 191 - 195WILSON, TMCCABE, EM
- [2] THEORY OF SCAN SPEED DEPENDENT OPTICAL BEAM INDUCED CURRENT IMAGES IN SEMICONDUCTORSOPTIK, 1987, 76 (01): : 18 - 22WILSON, TPESTER, PD
- [3] THEORY OF SCAN SPEED DEPENDENT OPTICAL BEAM INDUCED CURRENT IMAGES IN SEMICONDUCTORS.Optik (Jena), 1987, 76 (01): : 18 - 22Wilson, T.Pester, P.D.
- [4] TIME-DEPENDENT THEORY OF OPTICAL-BEAM-INDUCED CURRENT IMAGING OF DEFECTS IN SEMICONDUCTORSJOURNAL OF APPLIED PHYSICS, 1988, 64 (03) : 1131 - 1135PESTER, PDWILSON, T
- [5] OPTICAL-BEAM-INDUCED CURRENT AND PHOTOLUMINESCENCE TECHNIQUES FOR LOCALIZATION OF CRYSTALLOGRAPHIC DEFECTS IN OPTOELECTRONIC DEVICESMATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 24 (1-3): : 175 - 179MONTANGERO, PAZZINI, GADEFRANCESCHI, RMANCINI, MSERRA, L
- [6] OPTICAL BEAM INDUCED CURRENT IMAGING OF DISLOCATIONS IN SEMICONDUCTORSOPTIK, 1986, 75 (01): : 11 - 15WILSON, TMCCABE, EM
- [7] OPTICAL BEAM INDUCED CURRENT IMAGING OF DISLOCATIONS IN SEMICONDUCTORS.Optik (Jena), 1986, 75 (01): : 11 - 15Wilson, T.McCabe, E.M.
- [8] MODELING AND ANALYSIS OF LASER-BEAM INDUCED CURRENT IMAGES IN SEMICONDUCTORSSIAM JOURNAL ON APPLIED MATHEMATICS, 1993, 53 (01) : 187 - 204BUSENBERG, SFANG, WFITO, K
- [9] FLUORESCENCE OF ELECTRON-BEAM INDUCED CURRENT TO THE CHARACTERIZATION OF DEFECTS IN SEMICONDUCTORS CIRCUITSJOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1981, 6 (01): : 71 - 76DOMINE, G
- [10] ON THE THEORY OF ELECTRON-BEAM-INDUCED CURRENT CONTRAST FROM POINTLIKE DEFECTS IN SEMICONDUCTORSJOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1194 - 1199JAKUBOWICZ, A