HARDWARE SOFTWARE PROBLEMS YIELD TO TODAYS LOGIC ANALYZERS

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作者：

LOWE, K ^{[1
]}

VANHOOK, M ^{[1
]}

机构：

[1] GOULD INC,DIV DESIGN & TEST SYST,SANTA CLARA,CA

来源：

EDN MAGAZINE-ELECTRICAL DESIGN NEWS | 1984年 / 29卷 / 18期

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TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：203 / 208

页数：6

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