ACCELERATED TESTING HIGHLIGHTS CMOS FAILURE MODES

被引：0
|
作者：
JOHNSON, GM [1 ]
机构：
[1] MCDONNELL DOUGLAS ASTRONAUT CO E,ST LOUIS,MO
来源：
IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS | 1976年 / 12卷 / 05期
关键词：
D O I：
暂无
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：666 / 666
页数：1
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