FAR-INFRARED FREQUENCY-DEPENDENCE OF JOSEPHSON EFFECT IN NIOBIUM POINT CONTACTS

被引：0

作者：

WEITZ, DA ^{[1
]}

SKOCPOL, WJ ^{[1
]}

TINKHAM, M ^{[1
]}

机构：

[1] HARVARD UNIV,CAMBRIDGE,MA 02138

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1977年 / 22卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：374 / 374

页数：1

共 50 条

[1] FAR-INFRARED FREQUENCY-DEPENDENCE OF THE AC JOSEPHSON EFFECT IN NIOBIUM POINT CONTACTS
WEITZ, DA
SKOCPOL, WJ
TINKHAM, M
[J]. PHYSICAL REVIEW B, 1978, 18 (07): : 3282 - 3292
[2] CHARACTERIZATION OF NIOBIUM POINT CONTACTS SHOWING JOSEPHSON EFFECTS IN FAR INFRARED
WEITZ, DA
SKOCPOL, WJ
TINKHAM, M
[J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (09) : 4873 - 4880
[3] FREQUENCY-DEPENDENCE OF THE AC JOSEPHSON EFFECT IN NB POINT CONTACTS IN THE SUBMILLIMETER-WAVE REGION
NOGUCHI, T
MORITA, S
IMAI, S
TAKEUTI, Y
MIKOSHIBA, N
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (04) : L257 - L260
[4] FAR-INFRARED RESPONSE OF SUPERCONDUCTING POINT CONTACTS
STERLING, SA
RICHARDS, PL
[J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1968, 13 (03): : 476 - &
[5] JOSEPHSON-EFFECT FAR-INFRARED DETECTOR
GRIMES, CC
RICHARDS, PL
SHAPIRO, S
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (08) : 3905 - &
[6] STUDY INTO HIGH-FREQUENCY PROPERTIES OF SUPERCONDUCTING POINT CONTACTS IN THE FAR-INFRARED REGION
BASOV, NG
BELENOV, EM
VEDENEEV, SI
GUBIN, MA
MOTULEVICH, GP
NIKITIN, VV
STEPANOV, VA
USKOV, AV
[J]. KVANTOVAYA ELEKTRONIKA, 1979, 6 (08): : 1718 - 1729
[7] PROPERTIES OF JOSEPHSON POINT-CONTACT FAR-INFRARED DETECTORS
WEITZ, DA
SKOCPOL, WJ
TINKHAM, M
[J]. INFRARED PHYSICS, 1978, 18 (5-6): : 647 - 656
[8] FREQUENCY-DEPENDENCE OF JOSEPHSON CURRENT
HAMILTON, CA
[J]. PHYSICAL REVIEW B, 1972, 5 (03): : 912 - &
[9] REGENERATIVE JOSEPHSON EFFECT DETECTOR FOR FAR-INFRARED RADIATION
RICHARDS, PL
STERLING, SA
[J]. APPLIED PHYSICS LETTERS, 1969, 14 (12) : 394 - &
[10] POINT-CONTACT-TYPE JOSEPHSON HARMONIC MIXER FOR FREQUENCY-MEASUREMENT OF FAR-INFRARED LASERS
MIKI, Y
SAKUMA, E
MORIMURA, M
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) : 630 - 632

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