共 50 条
- [1] X-RAY INVESTIGATION OF SOME PECULIARITIES OF IMPURITY DISTRIBUTION IN STRONGLY-DOPED SILICON SINGLE CRYSTALS SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1968, 12 (06): : 955 - &
- [3] Anomalous behaviour of silicon single-crystals observed by X-ray diffraction Kohno, Atsushi, 1600, (33):
- [5] THE X-RAY DIFFRACTION PROPERTIES OF SILICON SINGLE CRYSTALS ARKIV FOR FYSIK, 1962, 22 (06): : 535 - 541
- [7] X-ray topo-tomography studies of linear dislocations in silicon single crystals JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2018, 51 : 1616 - 1622
- [10] THE ANOMALOUS X-RAY TRANSMISSION THROUGH SILICON SINGLE CRYSTALS ARKIV FOR FYSIK, 1963, 24 (01): : 81 - 88