OPERATING CHARACTERISTICS OF THIN-FILM RF-BIASED SQUIDS

被引:18
|
作者
FALCO, CM [1 ]
PARKER, WH [1 ]
机构
[1] UNIV CALIF,DEPT PHYS,IRVINE,CA 92664
关键词
D O I
10.1063/1.322049
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:3238 / 3243
页数:6
相关论文
共 50 条
  • [1] OBSERVATIONS OF RF-BIASED SQUIDS AT 9 GHZ AND 30 MHZ
    RACHFORD, FJ
    HUANG, CY
    WOLF, S
    NISENOFF, M
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (03): : 333 - 333
  • [2] REDUCTION OF EXCESS LOW-FREQUENCY NOISE IN RF-BIASED SQUIDS
    TABER, M
    CABRERA, B
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (09): : 1835 - 1837
  • [3] THIN-FILM RESISTIVE SQUIDS
    KRIVOY, GS
    KOCH, H
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1995, 5 (02) : 3244 - 3247
  • [4] NIOBIUM NITRIDE THIN-FILM SQUIDS BIASED AT 20 MHZ AND 9.2 GHZ
    WOLF, SA
    RACHFORD, FJ
    NISENOFF, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 386 - 388
  • [5] ADJUSTABLE RF-BIASED SQUID
    STRAYER, DM
    CATCHINGS, RM
    OVERSLUIZEN, T
    KITCHENS, TA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09): : 1434 - 1435
  • [6] GRANULAR NIOBIUM THIN-FILM SQUIDS
    RACHFORD, FJ
    WOLF, S
    KENNEDY, J
    NISENOFF, M
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (03): : 374 - 374
  • [7] Simulations of dual rf-biased sheaths and ion energy distributions arriving at a dual rf-biased electrode
    Guan, ZQ
    Dai, ZL
    Wang, YN
    PHYSICS OF PLASMAS, 2005, 12 (12) : 1 - 8
  • [8] ASSESSMENT OF HTS STEP-EDGE THIN-FILM RF-SQUIDS FOR NDT
    BOWMAN, RM
    MACFARLANE, JC
    COCHRAN, A
    KIRK, KJ
    PEGRUM, CM
    DONALDSON, GB
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1993, 6 (02): : 91 - 95
  • [9] DESIGN AND FABRICATION OF THIN-FILM RESISTIVE SQUIDS
    KRIVOY, GS
    ASSMANN, C
    PETERS, M
    KOCH, H
    JOURNAL OF LOW TEMPERATURE PHYSICS, 1995, 99 (1-2) : 107 - 120
  • [10] Dynamic model and electrical characteristics for RF-biased electronegative plasma sheath
    Lee, YD
    Oh, JJ
    Shin, JK
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2002, 30 (03) : 1320 - 1330