DETERMINATION OF LIFETIME AND DIFFUSION LENGTH IN SILICON SOLAR-CELLS BY SELF-BIASED (PHOTO-VOLTAGE) CAPACITANCE MEASUREMENTS

被引：1

|

作者：

SWARUP, P

JAIN, VK

机构：

来源：

ELECTRON DEVICE LETTERS | 1982年 / 3卷 / 09期

关键词：

D O I：

10.1109/EDL.1982.25560

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：259 / 261

页数：3

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