ELECTRON-OPTICAL CHARACTERISTICS OF A CONCAVE ELECTROSTATIC ELECTRON-MIRROR FOR A SCANNING ELECTRON-MICROSCOPE

被引：0
|
作者：
HAMARAT, RT
WITZANI, J
HORL, EM
机构：
来源：
SCANNING | 1984年 / 6卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：75 / 79
页数：5
相关论文
共 50 条
  • [1] COMPUTER CONTROL OF ELECTRON-OPTICAL PARAMETERS OF THE SCANNING ELECTRON-MICROSCOPE
    FUJIOKA, H
    NAKAMAE, K
    URA, K
    TAKASHIMA, S
    HARASAWA, K
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1987, 36 (05): : 327 - 327
  • [2] ELECTRON-OPTICAL COLUMN OF THE ELECTRON-MICROSCOPE
    MOSEEV, VV
    ANASKIN, IF
    STOYANOV, PA
    TIKHONOV, DD
    [J]. IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1983, 47 (06): : 1127 - 1129
  • [3] ANALYSIS OF MIRROR AREA OF AN ELECTROSTATIC ELECTRON-MIRROR MICROSCOPE
    ELKAREH, AB
    GRORUD, E
    [J]. OPTIK, 1975, 41 (05): : 488 - 505
  • [4] COMPUTER CONTROL OF ELECTRON-OPTICAL PARAMETERS OF THE SCANNING ELECTRON-MICROSCOPE (II)
    NAKAMAE, K
    MIYAJI, K
    FUJIOKA, H
    URA, K
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (05): : 262 - 262
  • [5] ELECTRON-OPTICAL PROPERTIES OF THE ELECTRON-MICROSCOPE GUN
    OHYE, T
    UCHIKAWA, Y
    [J]. JOURNAL OF ELECTRON MICROSCOPY, 1982, 31 (03): : 307 - 308
  • [6] IMPROVED ELECTRON-OPTICAL SYSTEM FOR THE REM-200 SCANNING ELECTRON-MICROSCOPE
    UDALTSOV, VI
    KUSHKOV, VD
    KOZLOV, IS
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1981, 24 (03) : 786 - 787
  • [7] ELECTRON-OPTICAL SYSTEM OF SCANNING ELECTRON-MICROSCOPE, X-RAY MICROANALYZER
    TOPORKOV, SA
    GELEVER, VD
    [J]. IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1988, 52 (07): : 1265 - 1268
  • [8] RELATION OF REFLECTED BEAM PARAMETERS TO ELECTRON-OPTICAL PROPERTIES OF A CONDENSER IN MIRROR ELECTRON-MICROSCOPE
    ARTAMONOV, OM
    KOMOLOV, SA
    [J]. IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1972, 36 (09): : 1961 - +
  • [9] ELECTRON-MICROSCOPE TRANSMISSION ELECTRON-MICROSCOPE AND SCANNING ELECTRON-MICROSCOPE
    WATANABE, T
    [J]. DENKI KAGAKU, 1986, 54 (08): : 667 - 670
  • [10] ELECTRON-OPTICAL PROPERTIES OF MIRROR, WORKING UNDER SHADOW CONDITIONS OF A MIRROR ELECTRON-MICROSCOPE .2.
    SEKUNOVA, LM
    YAKUSHEV, EM
    [J]. ZHURNAL TEKHNICHESKOI FIZIKI, 1975, 45 (04): : 732 - 740
12345