SURFACE CHANNELING OF SWIFT LIGHT-IONS - MEASUREMENTS AND SIMULATION

被引：17
|
作者：
HOU, M [1 ]
VARELAS, C [1 ]
机构：
[1] UNIV MUNICH,PHYS SECT,D-8000 MUNICH 40,FED REP GER
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1984年 / 33卷 / 02期
关键词：
D O I：
10.1007/BF00617618
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：121 / 131
页数：11
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