METALLIC CLUSTERS SURFACE INTERACTION - THE CASE OF PD/SIOX/N-SI(100)

被引：0
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作者：
BELLAMY, B
MECHKEN, S
MASSON, A
机构：
来源：
ZEITSCHRIFT FUR PHYSIK D-ATOMS MOLECULES AND CLUSTERS | 1993年 / 26卷
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中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
Atomic Force Microscopy (A.F.M.) and Rutherford back scattering (R.B.S.) have been employed to study the nucleation and growth phenomena of Palladium clusters scattered onto a thin (20 angstrom) layer of SiO(x), grown by plasma oxidation onto Si(100) doped B surface. X ray photoemission (XPS) of the 3d core level of palladium has permitted to follow the clusters silica interaction. Intrinsic final state size effect and extrinsic initial chemical state are discussed for clusters in the range of 10 to 10(4) atoms.
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页码：S61 / S63
页数：3
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