DEVELOPMENTS IN CONVERGENT BEAM ELECTRON-DIFFRACTION

被引：0

作者：

STEEDS, JW

VINCENT, R

机构：

来源：

JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES | 1983年 / 8卷 / 06期

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D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：419 / &

共 50 条

[1] CONVERGENT BEAM ELECTRON-DIFFRACTION
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MINERALOGICAL MAGAZINE, 1987, 51 (359) : 33 - 48
[2] FURTHER DEVELOPMENTS IN THE ANALYSIS OF CONVERGENT BEAM ELECTRON-DIFFRACTION (CBED) DATA
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INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (68): : 31 - 36
[3] TECHNIQUES OF CONVERGENT BEAM ELECTRON-DIFFRACTION
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[6] SELECTED AREA ELECTRON-DIFFRACTION (SAED) AND CONVERGENT BEAM ELECTRON-DIFFRACTION (CBED)
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[7] TECHNIQUES FOR CONVERGENT-BEAM ELECTRON-DIFFRACTION
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[8] SYMMETRY ENHANCEMENT IN CONVERGENT BEAM ELECTRON-DIFFRACTION
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UENO, O
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[9] STRUCTURE DETERMINATION BY CONVERGENT BEAM ELECTRON-DIFFRACTION
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[10] SOME APPLICATIONS OF CONVERGENT BEAM ELECTRON-DIFFRACTION
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