VACANCY COMPLEXES IN GAAS - EFFECTS ON IMPURITY COMPENSATION

被引:6
|
作者
CHADI, DJ
ZHANG, SB
机构
[1] Xerox Palo Alto Research Center, Palo Alto, CA 94304
来源
PHYSICAL REVIEW B | 1990年 / 41卷 / 08期
关键词
D O I
10.1103/PhysRevB.41.5444
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The energetics of shallow impurity compensation in GaAs via reactions of the type VAs (VGa+GaAs), where V denotes a vacancy and GaAs a Ga-antisite defect is examined. It is proposed that in n-type GaAs this single-atom-displacement reaction is unstable with respect to a similar type of process, namely, 2VAs (VAs+VGa+GaAs). The latter does not lead to any compensation of donors, thereby removing discrepancies between theoretical predictions and experimental results on donor passivation by native defects in GaAs. © 1990 The American Physical Society.
引用
收藏
页码:5444 / 5446
页数:3
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