PRECISION X-RAY TECHNIQUES FOR SEMICONDUCTORS

被引：0
|
作者：
MACRANDER, AT
机构：
来源：
ANNUAL REVIEW OF MATERIALS SCIENCE | 1988年 / 18卷
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：283 / 302
页数：20
相关论文
共 50 条
  • [1] Application of x-ray techniques in precision farming
    Arslan, S
    Inanc, F
    Gray, JN
    Colvin, TS
    REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 19A AND 19B, 2000, 509 : 1931 - 1938
  • [2] X-ray Radiocatalysis of semiconductors
    Higgins, Maria
    Rojas, Jessika
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2019, 257
  • [3] A precision x-ray spectrometer
    Terrill, HM
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1922, 6 (03): : 287 - 290
  • [4] Precision x-ray spectrometers
    Hudson, JC
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1924, 9 (03): : 259 - 301
  • [5] USE OF SEMICONDUCTORS IN X-RAY SPECTROSCOPY
    MAYERKUC.T
    MOMMSEN, H
    ZEITSCHRIFT FUR INSTRUMENTENKUNDE, 1967, 75 (10): : 309 - &
  • [6] X-ray topography in the study of semiconductors
    Korytár, D
    Ferrari, C
    ACTA PHYSICA SLOVACA, 2001, 51 (01) : 9 - 15
  • [7] Fabrication of high precision X-ray mask for X-ray grating of X-ray Talbot interferometer
    Noda, Daiji
    Tsujii, Hiroshi
    Takahashi, Naoki
    Hattori, Tadashi
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2010, 16 (8-9): : 1309 - 1313
  • [8] Fabrication of high precision X-ray mask for X-ray grating of X-ray Talbot interferometer
    Daiji Noda
    Hiroshi Tsujii
    Naoki Takahashi
    Tadashi Hattori
    Microsystem Technologies, 2010, 16 : 1309 - 1313
  • [9] RAPID PRECISION DETERMINATION OF COMPOSITION OF CONTINUOUS SOLID SOLUTIONS BY X-RAY TECHNIQUES
    CHERIN, P
    DAVIS, EA
    BIELAN, C
    ANALYTICAL CHEMISTRY, 1968, 40 (03) : 611 - &
  • [10] X-RAY FLASH TECHNIQUES
    GERMER, R
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (05): : 336 - 350
12345