ONSHORE HIGH-RESOLUTION SEISMIC PROFILING APPLIED TO SEDIMENTOLOGY

被引：30

作者：

JONGERIUS, P ^{[1
]}

HELBIG, K ^{[1
]}

机构：

[1] UNIV UTRECHT INST EARTH SCI,3508 TA UTRECHT,NETHERLANDS

来源：

GEOPHYSICS | 1988年 / 53卷 / 10期

关键词：

Data Processing - Data Acquisition - Geophysics - Seismic - Petroleum Geology - Sedimentology;

D O I：

10.1190/1.1442405

中图分类号：

P3 [地球物理学]; P59 [地球化学];

学科分类号：

0708 ; 070902 ;

摘要：

High-resolution seismic profiling is a valuable method for the exploration of the shallow subsurface. Currently, a resolution of 0.5 m can be attained. This resolution is sufficient to recognize small sedimentary features (channels, dunes, linear ridges, etc.) and to reconstruct the environment of deposition. The surveys described in this paper were carried out under favorable conditions on intertidal flats and beaches.

引用

页码：1276 / 1283

页数：8

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