DETERMINATION OF TRACE IMPURITIES IN HIGH-PURITY ALUMINUM-OXIDE BY INDUCTIVELY-COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY

被引：50

作者：

ISHIZUKA, T ^{[1
]}

UWAMINO, Y ^{[1
]}

TSUGE, A ^{[1
]}

KAMIYANAGI, T ^{[1
]}

机构：

[1] TAIMEI CHEM IND CO LTD,KAMI INAGUN,NAGANO 39945,JAPAN

来源：

ANALYTICA CHIMICA ACTA | 1984年 / 161卷 / JUL期

关键词：

D O I：

10.1016/S0003-2670(00)85798-0

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：285 / 291

页数：7

共 50 条

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