AC SUSCEPTIBILITY RESPONSE OF THIN-FILM SUPERCONDUCTORS NEAR TC - A THEORETICAL-STUDY

被引：69
|
作者：
SUN, JZ
SCHAREN, MJ
BOURNE, LC
SCHRIEFFER, JR
机构：
[1] Superconductor Technologies, Inc., Santa Barbara, CA 93111-2310
来源：
PHYSICAL REVIEW B | 1991年 / 44卷 / 10期
关键词：
D O I：
10.1103/PhysRevB.44.5275
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present a quantitative analysis of the ac susceptibility response of thin-film type-II superconductors near T(c), using a description based on the Bean critical-state model. The shape of the ac susceptibility transition is determined by the temperature dependence of the critical current density of the film. The ac-field-amplitude dependence of the susceptibility response is also given.
引用
收藏
页码：5275 / 5279
页数：5
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