X-RAY STANDING-WAVE ANALYSIS WITH HIGH REFLECTION ORDER AND NEAR-NORMAL INCIDENCE

被引：4
|
作者：
HUANG, KG
GIBSON, WM
ZEGENHAGEN, J
机构：
[1] SUNY ALBANY,DEPT PHYS,ALBANY,NY 12222
[2] AT&T BELL LABS,MURRAY HILL,NJ 07974
来源：
PHYSICAL REVIEW B | 1989年 / 40卷 / 06期
关键词：
D O I：
10.1103/PhysRevB.40.4216
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：4216 / 4219
页数：4
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