PRACTICAL ELECTRO-OPTIC DEFLECTION MEASUREMENTS SYSTEM

被引：14
|
作者：
HUTCHESON, LD [1 ]
机构：
[1] USN, WEAPONS CTR, MICHELSON LABS, CHINA LAKE, CA 93555 USA
来源：
OPTICAL ENGINEERING | 1976年 / 15卷 / 01期
关键词：
D O I：
10.1117/12.7971910
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：61 / 63
页数：3
相关论文
共 50 条
  • [1] ELECTRO-OPTIC DEFLECTION OF A LASER-BEAM
    SCHMIDT, UJ
    PHILIPS TECHNICAL REVIEW, 1976, 36 (05): : 117 - 132
  • [2] A REVIEW OF ELECTRO-OPTIC BEAM DEFLECTION TECHNIQUES
    BASS, JC
    RADIO AND ELECTRONIC ENGINEER, 1967, 34 (06): : 345 - &
  • [3] A comparison of beam deflection electro-optic switches
    Kirk, A. G.
    Plant, D. V.
    Menard, M.
    2008 INTERNATIONAL CONFERENCE ON PHOTONICS IN SWITCHING, 2008, : 6 - 7
  • [4] New electro-optic cell for non-standard electro-optic measurements
    Gyurova-Chausheva, A. J.
    Ivanov, G. S.
    Stoylov, S. P.
    BULGARIAN CHEMICAL COMMUNICATIONS, 2007, 39 (02): : 119 - 122
  • [5] ELECTRO-OPTIC DEFLECTION WITH BATIO3 PRISMS
    IPPEN, EP
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1966, QE 2 (06) : 152 - &
  • [6] Precision steering of an optical trap by electro-optic deflection
    Valentine, Megan T.
    Guydosh, Nicholas R.
    Gutierrez-Medina, Braulio
    Fehr, Adrian N.
    Andreasson, Johan O.
    Block, Steven M.
    OPTICS LETTERS, 2008, 33 (06) : 599 - 601
  • [7] Beam deflection with electro-optic polymeric waveguide prism array
    Sun, L
    Kim, JH
    Jang, CH
    Maki, JJ
    An, DC
    Zhou, QJ
    Lu, XJ
    Taboada, JM
    Chen, RT
    Tang, SN
    Zhang, H
    Steier, WH
    Ren, A
    Dalton, LR
    OPTOELECTRONIC INTEGRATED CIRCUITS IV, 2000, 3950 : 98 - 107
  • [8] Electro-optic measurements of poled polymeric films
    IBM Almaden Research Cent, San Jose, United States
    Mol Cryst Liq Cryst Sci Technol Sect B Nonlinear Opt, 1-4 (371-382):
  • [9] ELECTRO-OPTIC MEASUREMENTS OF PBS PBSE AND PBTE
    ASPNES, DE
    CARDONA, M
    PHYSICAL REVIEW, 1968, 173 (03): : 714 - &
  • [10] ELECTRO-OPTIC TV COMMUNICATIONS SYSTEM
    HANNAN, WJ
    BORDOGNA, J
    PENN, TE
    WALSH, TE
    PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1965, 53 (02): : 171 - &
12345