MEASUREMENT OF DIFFUSION LENGTH IN SOLAR CELLS

被引：41
|
作者：
REYNOLDS, JH [1 ]
MEULENBERG, A [1 ]
机构：
[1] COMSAT LABS, CLARKSBURG, MD 20734 USA
来源：
JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 06期
关键词：
D O I：
10.1063/1.1663633
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：2582 / 2592
页数：11
相关论文
共 50 条
  • [1] Diffusion length in CdTe by measurement of photovoltage spectra in CdS/CdTe solar cells
    Tousek, J
    Kindl, D
    Tousková, J
    Dolhov, S
    Poruba, A
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (01) : 460 - 465
  • [2] MEASUREMENT OF MINORITY-CARRIER DIFFUSION LENGTH IN POLYCRYSTALLINE SOLAR-CELLS
    SOPORI, BL
    LEGGE, RN
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (03) : C111 - C111
  • [3] Contactless photovoltage method for measurement of diffusion length of minority carriers in solar cells
    Tousek, J
    Kindl, D
    Tousková, J
    SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2000, 64 (01) : 29 - 35
  • [4] Effective diffusion length of multicrystalline solar cells
    Donolato, C
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (07) : 781 - 787
  • [5] DETERMINATION OF DIFFUSION LENGTH OF SOLAR-CELLS
    SCHEER, HC
    WAGEMANN, HG
    ARCHIV FUR ELEKTROTECHNIK, 1983, 66 (5-6): : 327 - 334
  • [6] Effective diffusion length of multicrystalline solar cells
    Donolato, C
    SOLID STATE PHENOMENA, 1999, 67-8 : 75 - 80
  • [7] Effective diffusion length of multicrystalline solar cells
    Istituto di Chimica e Tecnologia dei, Materiali e dei Componenti per, l'Elettronica , Bologna, Italy
    Semicond Sci Technol, 7 (781-787):
  • [8] Improved photovoltaic method for measurement of minority carrier diffusion length applied to silicon solar cells
    Tousek, J
    Kindl, D
    Tousková, J
    Dolhov, S
    SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2001, 69 (03) : 297 - 302
  • [9] Modeling of electron diffusion length in GaInAsN solar cells
    Kurtz, S
    Geisz, JF
    Friedman, DJ
    Olson, JM
    Duda, A
    Karam, NH
    King, RR
    Ermer, JH
    Joslin, DE
    CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000, 2000, : 1210 - 1213
  • [10] Characterization of diffusion length degradation in Czochralski silicon solar cells
    Reiss, JH
    King, RR
    Mitchell, KW
    APPLIED PHYSICS LETTERS, 1996, 68 (23) : 3302 - 3304
12345