COMBINED INTERFEROMETER FOR DISPLACEMENT MEASUREMENTS

被引:0
|
作者
VITUSHKIN, LF
SMIRNOV, MZ
机构
来源
DOKLADY AKADEMII NAUK SSSR | 1986年 / 287卷 / 03期
关键词
D O I
暂无
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:630 / 634
页数:5
相关论文
共 50 条
  • [1] Displacement measurements by a combined optical and x-ray interferometer(COXI)
    Eom, CI
    Yim, NB
    [J]. PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2, 1999, : 294 - 297
  • [2] DIGITAL SPECKLE PATTERN INTERFEROMETER FOR COMBINED MEASUREMENTS OF OUT-OF-PLANE DISPLACEMENT AND SLOPE
    NG, TW
    [J]. OPTICS COMMUNICATIONS, 1995, 116 (1-3) : 31 - 35
  • [3] Precise Displacement Measurements with a Tunable Laser and Interferometer
    Kim, Jongwon
    Ko, Kwang-Hoon
    Kim, Byungki
    [J]. JOURNAL OF THE KOREAN SOCIETY FOR NONDESTRUCTIVE TESTING, 2019, 39 (06) : 329 - 334
  • [4] DIFFERENTIAL LASER INTERFEROMETER FOR NANOMETER DISPLACEMENT MEASUREMENTS
    LEE, CK
    WU, TW
    [J]. AIAA JOURNAL, 1995, 33 (09) : 1675 - 1680
  • [5] LASER DIODE FEEDBACK INTERFEROMETER FOR STABILIZATION AND DISPLACEMENT MEASUREMENTS
    YOSHINO, T
    NARA, M
    MNATZAKANIAN, S
    LEE, BS
    STRAND, TC
    [J]. APPLIED OPTICS, 1987, 26 (05): : 892 - 897
  • [6] Development of a Coplanar Grating Interferometer for Displacement and Angle Measurements
    Hsu, Yi-Teng
    Hsieh, Hung-Lin
    [J]. OPTICS AND PHOTONICS FOR ADVANCED DIMENSIONAL METROLOGY II, 2022, 12137
  • [7] An optical standing-wave interferometer for displacement measurements
    Büchner, HJ
    Stiebig, H
    Mandryka, V
    Bunte, E
    Jäger, G
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2003, 14 (03) : 311 - 316
  • [8] A Novel Miniature Laser Diode Interferometer for Precision Displacement Measurements
    Chen, L. M.
    Fan, K. C.
    Zhou, H.
    [J]. PROCEEDINGS OF THE 38TH INTERNATIONAL MATADOR CONFERENCE, 2022, : 491 - 499
  • [9] An integrated double micro-interferometer for displacement and velocity measurements
    Severi, M
    Pouteau, P
    Mottier, P
    [J]. ECIO'99: 9TH EUROPEAN CONFERENCE ON INTEGRATED OPTICS AND TECHNICAL EXHIBITION, 1999, : 401 - 404
  • [10] MINIATURIZED SEMICONDUCTOR-LASER INTERFEROMETER FOR INDUSTRIAL DISPLACEMENT MEASUREMENTS
    BOEHNEL, HJ
    HOFLER, H
    [J]. TECHNISCHES MESSEN, 1985, 52 (09): : 321 - 326