DEPENDENCE OF PHOTOGRAPHIC NOISE ON ELECTRON ENERGIES

被引:0
|
作者
KAMIYA, Y
ARII, T
机构
[1] TOYOTA TECHNOL INST,TEMPA KU,NAGOYA 468,JAPAN
[2] NATL INST PHYSIOL SCI,OKAZAKI,AICHI 444,JAPAN
来源
JOURNAL OF ELECTRON MICROSCOPY | 1988年 / 37卷 / 05期
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中图分类号
TH742 [显微镜];
学科分类号
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页码:285 / 285
页数:1
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