ULTRASHORT OPTICAL WAVE-FORM MEASUREMENTS USING FREQUENCY-RESOLVED OPTICAL GATING

被引：38
|
作者：
TAFT, G
RUNDQUIST, A
MURNANE, MM
KAPTEYN, HC
DELONG, KW
TREBINO, R
CHRISTOV, IP
机构：
[1] SANDIA NATL LABS,COMBUST RES FACIL,LIVERMORE,CA 94551
[2] UNIV SOFIA,FAC PHYS,BU-1126 SOFIA,BULGARIA
来源：
OPTICS LETTERS | 1995年 / 20卷 / 07期
关键词：
D O I：
10.1364/OL.20.000743
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We measure the intensity and phase of ultrashort pulses from a self-mode-locked Ti:sapphire laser using the recently developed technique of frequency-resolved optical gating. These results represent to our knowledge the shortest complete optical waveform characterization measurements performed to date. We also verify recent theoretical calculations that predict that the main limitation on the pulse duration from these lasers is the presence of uncompensated higher-order dispersion.
引用
收藏
页码：743 / 745
页数：3
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