MICROSTRUCTURAL ANALYSES OF ADVANCED INORGANIC MATERIALS

被引:0
|
作者
THOMAS, G [1 ]
机构
[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,NATL CTR ELECTRON MICROSCOPY,BERKELEY,CA 94720
关键词
D O I
10.1016/0304-3991(94)90113-9
中图分类号
TH742 [显微镜];
学科分类号
摘要
We live and work in a world of materials. Modern technology depends critically on the availability of advanced materials, e.g., in transportation, communications, data processing, production systems, etc., and more and more emphasis is being placed on research and development of materials. In order to tailor materials to meet specific performance requirements (mechanical/physical properties), it is essential to understand the relationships Synthesis and Processing - Structure - Performance. Processing develops microstructure, mesostructure and chemical distribution of the components. These in turn determine properties. In order to characterize these features, high resolution techniques such as electron microscopy, microdiffraction and microanalysis are required. This paper, dedicated to Professor H. Hashimoto who has made so many outstanding contributions to the field, gives two examples of the applications of electron microscopy to understanding and developing advanced ceramics, viz. silicon nitride and aluminum nitride.
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页码:145 / 155
页数:11
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