CHARACTERIZATION OF CU-RH/SIO2 BY TEMPERATURE-PROGRAMMED DESORPTION (TPD) OF HYDROGEN

被引:3
|
作者
CHUANG, SSC [1 ]
SOONG, Y [1 ]
NOCETI, RP [1 ]
SCHEHL, RR [1 ]
机构
[1] US DOE,PITTSBURGH ENERGY TECHNOL CTR,PITTSBURGH,PA 15236
来源
关键词
D O I
10.1007/BF02070063
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The presence of Cu on Rh/SiO2 inhibited H-2 chemisorption at 303 K and suppressed CO hydrogenation. TPD study shows that chemisorption of H-2 on Cu-Rh/SiO2 is an activated process at 303 K.
引用
收藏
页码:31 / 36
页数:6
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