HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF SILICA AEROGEL TRANSPORT INSULATION

被引：0

|

作者：

MAZUR, JH ^{[1
]}

LAMPERT, CM ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV APPL SCI,BERKELEY,CA 94720

来源：

PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 1984年 / 502卷

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：123 / 127

页数：5

相关论文

共 50 条

[1] STUDY OF THE STRUCTURE OF SILICA GLASS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
BANDO, Y
ISHIZUKA, K
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 33 (03) : 375 - 382
[2] RESOLUTION IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
OKEEFE, MA
ULTRAMICROSCOPY, 1992, 47 (1-3) : 282 - 297
[3] STUDY OF MINERALS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
MORIMOTO, N
JOURNAL OF ELECTRON MICROSCOPY, 1976, 25 (01): : 56 - 56
[4] HIGH-RESOLUTION ELECTRON-MICROSCOPY
COWLEY, JM
ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1987, 38 : 57 - 88
[5] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF BELITE
WANG, YG
ZOU, BS
KUO, KH
FENG, XJ
WANG, L
LONG, SZ
JOURNAL OF MATERIALS SCIENCE, 1989, 24 (03) : 877 - 880
[6] HIGH-RESOLUTION ELECTRON-MICROSCOPY
HASHIMOTO, H
ULTRAMICROSCOPY, 1984, 12 (1-2) : 90 - 90
[7] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF GEASSE
SIEGRIST, T
WESSICKEN, R
MATERIALS RESEARCH BULLETIN, 1982, 17 (03) : 351 - 354
[8] HIGH-RESOLUTION ELECTRON-MICROSCOPY
SMITH, DJ
HELVETICA PHYSICA ACTA, 1983, 56 (1-3): : 463 - 477
[9] HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY OF SULFATHIAZOLE CRYSTALS
LUKLINSKA, ZH
SOLANKE, OO
SUMMERS, MP
JOURNAL OF PHARMACY AND PHARMACOLOGY, 1989, 41 (08) : 559 - 561
[10] MICROSTRUCTURE OF CARBON - A HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY
BAN, LL
HESS, WM
CARBON, 1972, 10 (03) : 345 - &

← 1 2 3 4 5 →