QUANTITATIVE-ANALYSIS OF INTENSITIES IN X-RAY TOPOGRAPHS BY ENHANCED MICROFLUORESCENCE

被引：0

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作者：

WEISSMANN, S

GREENHUT, VA

CHAUDHURI, J

KALMAN, ZH

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1983年 / 16卷 / DEC期

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D O I：

10.1107/S0021889883011164

中图分类号：

O6 [化学];

学科分类号：

0703 ;

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页码：606 / 610

页数：5

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