INFRARED EXAMINATION OF MICRO SAMPLES - APPLICATION OF A SPECULAR REFLECTANCE SYSTEM

被引：6

|

作者：

SLOANE, HJ

JOHNS, T

ULRICH, WF

CADMAN, WJ

机构：

来源：

APPLIED SPECTROSCOPY | 1965年 / 19卷 / 04期

关键词：

D O I：

10.1366/000370265789619845

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

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页码：130 / &

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