TUNNELING MICROSCOPY AND SPECTROSCOPY OF MOLECULAR-BEAM EPITAXY GROWN GAAS-ALGAAS INTERFACES

被引:134
|
作者
ALBREKTSEN, O [1 ]
ARENT, DJ [1 ]
MEIER, HP [1 ]
SALEMINK, HWM [1 ]
机构
[1] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
关键词
D O I
10.1063/1.103563
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the first observation of GaAs/AlGaAs compound multilayers and interfaces at atomic scale resolution. Using a scanning tunneling microscope, the atomic registry in the epitaxial layers and their interfaces was observed. The semiconductor band gaps and valence-band offsets relative to the Fermi level are obtained via local spectroscopy in the GaAs and AlGaAs multilayers.
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页码:31 / 33
页数:3
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