COMPUTER SOFTWARE QUALITY MEASUREMENTS AND METRICS

被引：2
|
作者：
SHERIF, YS
NG, E
STEINBACHER, J
机构：
来源：
MICROELECTRONICS RELIABILITY | 1985年 / 25卷 / 06期
关键词：
D O I：
10.1016/0026-2714(85)90486-X
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1105 / 1150
页数：46
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