1/F NOISE IN RU-BASED THICK-FILM RESISTORS

被引：24
|
作者：
CHEN, TM
SU, SF
SMITH, D
机构：
来源：
SOLID-STATE ELECTRONICS | 1982年 / 25卷 / 08期
关键词：
D O I：
10.1016/0038-1101(82)90213-1
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：821 / 827
页数：7
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