MAGNETIC-FIELD EMISSION GUN FOR ELECTRON-BEAM TESTING

被引：0
|
作者：
TROYON, M
HOAN, N
DEBEAUREGARD, FC
MONSALLUT, P
机构：
[1] OPEA, F-94310 VINCENNES, FRANCE
[2] CAMECA SA, F-92403 COURBEVOIE, FRANCE
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
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页码：101 / 102
页数：2
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