RELIABILITY EVALUATION OF FAULT-TOLERANT SYSTEMS - EFFECT OF VARIABILITY IN FAILURE RATES

被引：0
|
作者：
IYER, RK
机构：
[1] STANFORD UNIV,CTR RELIABLE COMP,DEPT ELECT ENGN,COMP SYST LAB,STANFORD,CA 94305
[2] STANFORD UNIV,DEPT COMP SCI,STANFORD,CA 94305
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1984年 / 33卷 / 02期
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D O I：
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中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页码：197 / 200
页数：4
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