CONSIDERATION OF X-RAY ABSORPTION IN SINGLE-CRYSTAL DIFFRACTOMETRY .2. DETERMINATION OF SHAPE AND DIMENSIONS OF A CRYSTAL

被引：0

作者：

UDELNOV, AI ^{[1
]}

STRUCHKOV, YT ^{[1
]}

机构：

[1] ACAD SCI USSR,INST ORGANOELEMENT CPDS,MOSCOW,USSR

来源：

KRISTALLOGRAFIYA | 1977年 / 22卷 / 01期

关键词：

D O I：

暂无

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：44 / 49

页数：6

共 50 条

[1] CONSIDERATION OF X-RAY ABSORPTION IN SINGLE-CRYSTAL DIFFRACTOMETRY .3. RESULTS OF USING SHAPE AND GAUSAB PROGRAM COMPLEXES
UDELNOV, AL
STRUCHKOV, YT
[J]. KRISTALLOGRAFIYA, 1977, 22 (05): : 946 - 949
[2] REVIEW OF METHODS FOR THE DETERMINATION OF CRYSTAL ORIENTATION AND UNIT CELLS IN X-RAY SINGLE-CRYSTAL DIFFRACTOMETRY
CLEGG, W
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01): : 22 - 23
[3] Study of heterostructures according to single-crystal X-ray diffractometry
Lyutsau A.V.
Krymko M.M.
Enisherlova K.L.
Temper E.M.
Razgulyaev I.I.
[J]. Russian Microelectronics, 1600, Maik Nauka Publishing / Springer SBM (42): : 517 - 524
[4] A new radiative microfurnace for X-ray single-crystal diffractometry
Molin, G
Martignago, F
Dal Negro, A
[J]. EUROPEAN JOURNAL OF MINERALOGY, 2001, 13 (03) : 557 - 563
[5] Single-crystal X-ray diffractometry using synchrotron radiation
Eichhorn, KD
[J]. EUROPEAN JOURNAL OF MINERALOGY, 1997, 9 (04) : 673 - 692
[6] CORRECTION FOR ABSORPTION AND BEAM INHOMOGENEITY IN X-RAY SINGLE-CRYSTAL DIFFRACTOMETRY - METHOD OF ANALYTICAL INTEGRATION
MARKOV, VT
FETISOV, GV
ZHUKOV, SG
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1990, 23 : 94 - 98
[7] THE ACCURATE DETERMINATION OF CELL DIMENSIONS FROM SINGLE-CRYSTAL X-RAY PHOTOGRAPHS
FARQUHAR, MCM
LIPSON, H
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1946, 58 (326): : 200 - 206
[8] ACCURATE DETERMINATION OF CELL DIMENSIONS FROM SINGLE-CRYSTAL X-RAY PHOTOGRAPHS
HERBSTEIN, FH
[J]. ACTA CRYSTALLOGRAPHICA, 1963, 16 (04): : 255 - &
[9] THE ACCURATE DETERMINATION OF CELL DIMENSIONS FROM SINGLE-CRYSTAL X-RAY PHOTOGRAPHS
WEISZ, O
COCHRAN, W
COLE, WF
[J]. ACTA CRYSTALLOGRAPHICA, 1948, 1 (1-6): : 83 - 88
[10] ON THE DETERMINATION OF CRYSTAL AND COUNTER SETTINGS FOR A SINGLE-CRYSTAL X-RAY DIFFRACTOMETER
ARNDT, UW
PHILLIPS, DC
[J]. ACTA CRYSTALLOGRAPHICA, 1957, 10 (08): : 508 - 510

← 1 2 3 4 5 →