BREAKING THE DIFFRACTION RESOLUTION LIMIT BY STIMULATED-EMISSION - STIMULATED-EMISSION-DEPLETION FLUORESCENCE MICROSCOPY

被引：4355
|
作者：
HELL, SW
WICHMANN, J
机构：
[1] Department of Medical Physics, University of Turku, Turku, 20521
来源：
OPTICS LETTERS | 1994年 / 19卷 / 11期
关键词：
D O I：
10.1364/OL.19.000780
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We propose a new type of scanning fluorescence microscope Capable of resolving 35 nm in the far field. We overcome the diffraction resolution limit by employing stimulated emission to inhibit the fluorescence process in the outer regions of the excitation point-spread function. In contrast to near-field scanning optical microscopy, this method can produce three-dimensional images of translucent specimens.
引用
收藏
页码：780 / 782
页数：3
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