THE EFFECT OF ROUGHNESS ON THE MAGNETORESISTANCE OF FE/CR MULTILAYERS

被引：34
|
作者：
RENSING, NM [1 ]
PAYNE, AP [1 ]
CLEMENS, BM [1 ]
机构：
[1] STANFORD UNIV, DEPT APPL PHYS, STANFORD, CA 94305 USA
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1993年 / 121卷 / 1-3期
关键词：
D O I：
10.1016/0304-8853(93)91240-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We investigated magnetoresistance in wedged Fe/Cr multilayers grown at several sputtering pressures. Low angle X-ray scattering showed that interface roughness increased with higher sputtering pressure. The increased roughness was accompanied by an increase in saturation resistance, which results in a decrease in fractional magnetoresistance. The maximum magnetoresistance (measured at room temperature) was 7.3 and 4.0% for the films grown at 1.4 and 10 mT Ar, respectively, both at the region with 13 angstrom Cr layers.
引用
收藏
页码：436 / 439
页数：4
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