TEMPERATURE-DEPENDENCE OF THE HOOGE CONSTANT FOR FLICKER NOISE IN SYSTEMS WITH JOULE THERMAL EMISSION

The formula for the spectral density of the fluctuations is derived on the basis of analysis of the thermal conduction equation with random Langevin sources of volumetric thermal emission and thermal flux. It is shown that the spectrum proportional to omega-1 (flicker noise) at low frequencies (omega --> 0) is related only to fluctuations in the thermal emission. A nonmonotonic behavior is established for dependence the coefficient, which determines the amplitude of the temperature fluctuations (the Hooge ''constant'') on the temperature of the system or sample. A qualitative correspondence is obtained between calculations and experimental data for thin metallic silver and copper films.