MODIFIED SAMPLE HOLDER FOR LOW-TEMPERATURE DEEP-LEVEL TRANSIENT SPECTROSCOPY, CURRENT-VOLTAGE AND CAPACITANCE-VOLTAGE MEASUREMENTS

被引：3
|
作者：
MYBURG, G
MEYER, WE
AURET, FD
机构：
[1] Department of Physics, University of Pretoria, Pretoria
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 03期
关键词：
D O I：
10.1063/1.1143175
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This note describes the design, construction, and test results of a modified sample holder used during low-temperature deep-level transient spectroscopy, current-voltage and capacitance-voltage measurements. This improved sample holder allows temperature scan rates of up to 6 K/min with a temperature shift of less than 1 K. High electrical isolation makes this sample holder also suitable for low-temperature current-voltage and capacitance-voltage measurements.
引用
收藏
页码：2101 / 2102
页数：2
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