OXIDATION OF SI(111)-(7X7) AS STUDIED BY SCANNING TUNNELING MICROSCOPY

被引：87
|
作者：
LEIBSLE, FM [1 ]
SAMSAVAR, A [1 ]
CHIANG, TC [1 ]
机构：
[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
来源：
PHYSICAL REVIEW B | 1988年 / 38卷 / 08期
关键词：
D O I：
10.1103/PhysRevB.38.5780
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：5780 / 5783
页数：4
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