RESOLUTION OF THE FIELD-ION MICROSCOPE

被引：7

作者：

DECASTILHO, CMC

KINGHAM, DR

机构：

[1] VG SCI LTD,EAST GRINSTEAD RH19 1UB,ENGLAND

[2] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB3 0HE,ENGLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1987年 / 20卷 / 01期

关键词：

ELECTRIC FIELDS - HELIUM - Ionization - MATHEMATICAL TECHNIQUES - Numerical Analysis;

D O I：

10.1088/0022-3727/20/1/018

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Equations for resolution in the field ion microscope are reviewed and modifications are suggested. Calculations are made of each contributing term, based on a proposed model for the electric field variation. Comparison with experimental results is made. The revised equations strongly indicate that thermal accommodation of He imaging gas prior to ionisation is almost complete. Instead of the gas temperature being 6. 5 to 7. 3 times the tip temperature as estimated by Chen and Seidman, a factor of only 1. 3 to 1. 5 now seems plausible.

引用

页码：116 / 124

页数：9

共 50 条

[1] ON RESOLUTION OF FIELD-ION MICROSCOPE
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JOURNAL OF APPLIED PHYSICS, 1967, 38 (08) : 3421 - &
[2] RESOLUTION OF FIELD-ION MICROSCOPE
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[3] RESOLUTION AND CONTRAST IN THE FIELD-ION MICROSCOPE
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[4] FIELD-ION MICROSCOPE
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[5] FIELD-ION MICROSCOPE
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[7] SPECTRAL RESOLUTION METHOD FOR AN ATOM PROBE FIELD-ION MICROSCOPE
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[9] MAGNIFICATION IN THE FIELD-ION MICROSCOPE
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[10] DESIGN OF A FIELD-ION MICROSCOPE
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