共 50 条
- [1] REM-200 NEW SERIAL SCANNING ELECTRON-MICROSCOPE IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1977, 41 (05): : 848 - 850
- [9] SCANNING ELECTRON-MICROSCOPE MAGNIFICATION CALIBRATION FOR METROLOGY APPLICATIONS INTEGRATED CIRCUIT METROLOGY, INSPECTION, AND PROCESS CONTROL III, 1989, 1087 : 46 - 55
- [10] REM-50-01 SCANNING ELECTRON-MICROSCOPE SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1987, 54 (10): : 609 - 610