MEASURING AC EMITTER AND BASE SERIES RESISTANCES IN BIPOLAR-TRANSISTORS

被引:0
|
作者
NIITSU, Y
机构
关键词
SEMICONDUCTOR DEVICES; BIPOLAR TRANSISTORS; EMITTER RESISTANCE; BASE RESISTANCE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A convenient method for determining emitter and base resistances from small signal measurements has been developed. This method is based on Neugroschel's method, but the frequency has been varied instead of varying beta0. It is demonstrated that the base resistance was successfully extracted. The extracted emitter resistance depended on the collector current because of the difference between the exact g(m) value and the approximated one, I(C)/V(T). It has also been shown that the proposed method is more robust than the conventional impedance-circle method even when cross-talk ocuurs.
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页码:608 / 614
页数:7
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