Study of Morphology of Graphene using Atomic Force Microscopy and Raman Spectroscopy

被引：2
|
作者：
Drewniak, S. [1 ]
Pustelny, T. [1 ]
Pasternak, I. [2 ]
Krajewska, A. [2 ,3 ]
Konieczny, G. [1 ]
机构：
[1] Silesian Tech Univ, Dept Optoelect, 2A Akademicka St, PL-44100 Gliwice, Poland
[2] Inst Elect Mat Technol, PL-01919 Gliwice, Poland
[3] Mil Univ Technol, Inst Optoelect, PL-00908 Warsaw, Poland
来源：
PHOTONICS LETTERS OF POLAND | 2014年 / 6卷 / 04期
关键词：
D O I：
10.4302/plp.2014.4.02
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This paper presents an analysis of a graphene layer imposed on a resistance sensing structure. All the studies are directed to determine the quantity and quality of the graphene layer. We present the results of the experiments using atomic force microscopy, electron microscopy and Raman spectroscopy. The Raman spectra were subjected to detailed analyses, especially the position and half width of the 2D peak.
引用
收藏
页码：120 / 122
页数：3
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