MEASUREMENT TECHNIQUES FOR SUB-MICRON RESIST IMAGES

被引：5

|

作者：

ROSENFIELD, MG

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 06期

关键词：

D O I：

10.1116/1.584138

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：1944 / 1949

页数：6

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