APPLICATION OF THE MOIRE TECHNIQUE TO ELECTRON HOLOGRAPHY

被引：0
|
作者：
NOMURA, S [1 ]
TONOMURA, A [1 ]
MATSUDA, T [1 ]
机构：
[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1982年 / 31卷 / 03期
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中图分类号：
TH742 [显微镜];
学科分类号：
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页码：311 / 311
页数：1
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