ION-IMPLANTED DIAMOND TIP FOR A SCANNING TUNNELING MICROSCOPE

被引：41
|
作者：
KANEKO, R
OGUCHI, S
机构：
[1] NTT Applied Electronics Laboratories, Tokyo, 180, Musashinoshi
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1990年 / 29卷 / 09期
关键词：
Atomic resolution; Diamond; Ion implant; Stm; Tip;
D O I：
10.1143/JJAP.29.1854
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
An ion-implanted diamond tip sharpened to a radius of about 100 nm has sufficient conductivity for scanning tunneling microscopy. This tip can be used repeatedly even if it contacts the sample surface. Because the radius of the tip can be easily checked and does not show much wear from repeated usage, the relation of the tip radius to image resolution can be estimated. © 1990 The Japan Society of Applied Physics.
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页码：1854 / 1855
页数：2
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